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This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). It presents a fast and highly fault efficient SAT-based ATPG framework.

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Part I: Preliminaries and Previous Work.- Circuits and Testing.- Boolean Satisfiability.- ATPG Based on Boolean Satisfiability.- Part II: New SAT Techniques and their Application in ATPG.- Dynamic Clause Activation.- Circuit-based Dynamic Learning.- Part III: High Quality Delay Test Generation.- High Quality ATPG for Transition Faults.- Path Delay Fault Model.- Summary and Outlook.

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